The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2021

Filed:

Jul. 02, 2020
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Hendrikus Van Lierop, Bj Weert, NL;

Alexander Hulsker, Nijmegen, NL;

Jaap Verheggen, Wijchen, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G01N 21/95 (2006.01); G02B 6/35 (2006.01); G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G02B 26/0833 (2013.01); G01N 21/55 (2013.01); G01N 21/95 (2013.01); G02B 6/3514 (2013.01); G02B 6/3518 (2013.01); G02B 6/3584 (2013.01);
Abstract

Systems and methods are provided for monitoring properties of a microelectromechanical systems (MEMS) oscillating structure. A system includes a MEMS oscillating structure configured as a non-linear resonator to oscillate about a rotation axis; a driver configured to generate a driving force for driving the MEMS oscillating structure about the rotation axis according to an operating response curve during which the MEMS oscillating structure is in resonance, the driver further configured to decrease the driving force when the MEMS oscillating structure is at a predefined tilt angle to induce an oscillation decay of the MEMS oscillating structure; a measurement circuit configured to measure an oscillation frequency and a tilt angle amplitude of the MEMS oscillating structure during a decay period; and processing circuitry configured to determine at least one characteristic of the MEMS oscillating structure based on at least one of the measured oscillation frequency and the measured tilt angle amplitude.


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