The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2021

Filed:

Feb. 06, 2019
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

James Arthur McDonald, Minneapolis, MN (US);

Mark A. Ahlbrecht, Champlin, MN (US);

Zdenek Kana, Dubnany, CZ;

Assignee:

Honeywell International Inc., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/20 (2010.01); G01S 19/23 (2010.01);
U.S. Cl.
CPC ...
G01S 19/20 (2013.01); G01S 19/23 (2013.01);
Abstract

A method for computing and applying alternative uncertainty limits is provided. The method includes generating a main solution from a plurality of received measurement signals. A solution separation is applied using a filter bank to generate sub-solutions from the received plurality of measurement signals. Each sub-solution uses all of the measurement signals from the plurality of measurement signals except one measurement signal to generate the associated sub-solution. Each sub-solution excludes a different measurement signal. One sub-solution is selected as fault free. A difference between the main solution and the selected sub-solution is determined. The determined difference is added to a rare normal protection limit to create a solution with improved integrity bounding. The solution with improved integrity bounding is then implemented.


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