The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2021

Filed:

May. 28, 2020
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Liang Li, Shanghai, CN;

Hui Jia, Shanghai, CN;

Qin Zhen, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/40 (2020.01);
U.S. Cl.
CPC ...
G01R 31/40 (2013.01);
Abstract

Techniques and apparatuses are provided for testing a charge pump. A test circuit detects voltage drop-offs in a voltage signal provided by a charge pump in a test period. A comparator is used to compare the voltage signal to a divided down, delayed version of the signal. A counting circuit is connected to an output of the comparator to determine a number of the drop-offs in the test period. A control circuit such as an on-chip state machine compares the number of drop-offs to a maximum allowable number of drop-offs to set a pass/fail status of the charge pump. The control circuit can configure various parameters of the test, including a ratio of a voltage divider, and the maximum allowable number of drop-offs based on the charge pump being tested.


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