The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2021
Filed:
Feb. 27, 2019
Applicant:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Inventors:
Assignee:
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/07 (2006.01); G01N 29/44 (2006.01); G01N 29/14 (2006.01);
U.S. Cl.
CPC ...
G01N 29/14 (2013.01); G01N 29/043 (2013.01); G01N 29/07 (2013.01); G01N 29/44 (2013.01); G01N 2291/0258 (2013.01); G01N 2291/106 (2013.01); G01N 2291/267 (2013.01);
Abstract
According to one embodiment, a detection system of an embodiment includes a sensor configured to detect elastic waves and a determiner. The determiner determines a region where an elastic wave generation source is positioned on the basis of waveform information if the waveform information including a plurality of peak groups related to one elastic wave is included in a detection result of the sensor.
Fumikura, Tomoya. (2021). Detection system, detection device, and detection method (U.S. Patent No. 11073498). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11073498
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile