The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2021
Filed:
Dec. 21, 2018
Shenzhen Dikai Industrial Co., Ltd., Shenzhen, CN;
Xiuling Zhu, Shenzhen, CN;
Gary Bruce Peckham, Shenzhen, CN;
Shenzhen Dikai Industrial Co., Ltd., Shenzhen, CN;
Abstract
A multi-functional precious stone testing apparatus includes a microcontroller, a measuring unit for measuring properties of the testing object, and a functional unit. The measuring unit is arranged to measure one of a combination of ultraviolet and infrared distributions of the testing object and a combination of thermal and electrical conductivities of the testing object. The microcontroller analyzes a result from the measuring unit to generate a test result of the testing object, wherein the microcontroller includes a communication unit for connecting with an electronic device to transmit the test result thereto. The functional unit includes a voice indicator that generates a voice indication signal of the test result.