The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2021
Filed:
Feb. 19, 2020
Yokogawa Electric Corporation, Tokyo, JP;
Hikaru Shimizu, Musashino, JP;
Takeshi Kuwagata, Musashino, JP;
Megumi Goto, Musashino, JP;
Saori Handa, Musashino, JP;
YOKOGAWA ELECTRIC CORPORATION, Tokyo, JP;
Abstract
A turbidity measurement method includes irradiating a first irradiation light Lhaving a first spectrum E, detecting a first measured light MLbased on the first irradiation light L, irradiating a second irradiation light Lhaving a second spectrum Edifferent from the first spectrum E, detecting a second measured light MLbased on the second irradiation light L, calculating turbidity of a liquid to be measured, and correcting at least one of a first parameter related to turbidity calculation associated with the first irradiation light Land a second parameter related to turbidity calculation associated with the second irradiation light Lso that the calculated turbidity of the liquid to be measured corresponds to the turbidity of the liquid to be measured as measured using another light source serving as a standard of comparison.