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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11073446 B1

PDFFull Text
Date of Patent:
Jul. 27, 2021

Filed:

Mar. 15, 2017

Wear inspection apparatus and wear inspection method

Applicant:

Mitsubishi Heavy Industries Engineering, Ltd., Yokohama, JP;

Inventor:

Kazuyuki Wakasugi, Tokyo, JP;

Assignee:

MITSUBISHI HEAVY INDUSTRIES ENGINEERING, LTD., Yokohama, JP;

Attorney:

Kanesaka Berner and Partners LLP

Primary Examiner:

Leslie J Evanisko

Int. Cl.
CPC ...
G01M 17/02 (2006.01); G01B 11/24 (2006.01); G01B 21/00 (2006.01); G01B 21/04 (2006.01); B60C 19/00 (2006.01); F16D 66/02 (2006.01); B60L 5/38 (2006.01); F16D 66/00 (2006.01);
U.S. Cl.
CPC ...
G01M 17/027 (2013.01); B60C 19/00 (2013.01); B60L 5/38 (2013.01); F16D 66/02 (2013.01); G01B 11/24 (2013.01); G01B 21/00 (2013.01); G01B 21/045 (2013.01); G01M 17/02 (2013.01); F16D 2066/006 (2013.01);
Abstract

A wear inspection apparatus includes a data acquisition unit which is configured to acquire surface shape data including information indicating a shape of a surface of a part wearing as a vehicle travels, and an approximation processing unit which is configured to calculate an approximation line for the acquired surface shape data and calculates a degree of wear of the part from the approximation line and a worn portion included in the surface shape data.

Find Patent Forward Citations

Wakasugi, Kazuyuki. (2021). Wear inspection apparatus and wear inspection method (U.S. Patent No. 11073446). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11073446

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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