The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2021
Filed:
Oct. 29, 2018
Corning Incorporated, Corning, NY (US);
Jerry Lee Hepburn, Corning, NY (US);
Aniello Mario Palumbo, Painted Post, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
Provided herein are measurement systems including a micrometer assembly for receiving a length of tubing, the micrometer assembly including a plurality of non-contact optical micrometers disposed around the length of tubing for measuring an outer diameter (OD) at a first plurality of positions along a circumference of the length of tubing. The measurement system may further include a displacement gauge assembly for receiving the length of tubing from the optical micrometer assembly, the displacement gauge assembly including a plurality of non-contact gauges disposed around the length of tubing for measuring a wall thickness at a second plurality of positions along the circumference of the length of tubing. A controller receives the OD measurements and thickness measurements, and determines an inner diameter and a concentricity of the length of glass tubing based on an index of refraction of the length of glass tubing, the OD measurements, and the thickness measurements.