The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2021

Filed:

Aug. 20, 2019
Applicant:

Government of the United States of America, As Represented BY the Secretary of Commerce, Gaithersburg, MD (US);

Inventor:

Joshua A. Gordon, Lafayette, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01); G01B 11/00 (2006.01); G01B 21/04 (2006.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); G01B 5/008 (2013.01); G01B 21/042 (2013.01); G06T 7/80 (2017.01); G06T 2207/30204 (2013.01);
Abstract

A non-contact coordinate measuring machine includes: a noncontact metrology probe including: first and second cameras, wherein the second camera has a second field of view that overlaps a first field of view in a prime focal volume; a third camera has a third field of view that overlaps the prime focal volume and forms a probe focal volume; a multidimensional motion stage comprising: a machine coordinate system and motion arms that move the noncontact metrology probe in a machine coordinate system; a camera platform on which the cameras are disposed; a tracker with a world coordinate system and that determines a location of the probe focal volume in a tracker field of view, the non-contact coordinate measuring machine having the noncontact metrology probe for non-contact coordinate measurement of an object in an absence a stylus and in an absence of physical contact with the object.


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