The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2021
Filed:
May. 08, 2017
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Dirk Schaefer, Hamburg, DE;
Michael Grass, Buchholz in der Nordheide, DE;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/12 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4014 (2013.01); A61B 6/12 (2013.01); A61B 6/4028 (2013.01); A61B 6/4266 (2013.01); A61B 6/4464 (2013.01); A61B 6/487 (2013.01); A61B 6/545 (2013.01);
Abstract
A system (SC) for controlling operation of a multi-focal-spot X-ray imager (IA). The system comprises a projection direction determiner (PDD) configured to determine a projection direction for an object (OB) to be imaged, based on a geometric structure of a model m(OB) for the object (OB). A selector (SX) of the system is configured to select, from the imager (IA)'s plurality of focal-spot-detector pairs (IPj) with different optical axes (OXj), at least one target pair whose optical axis corresponds to the determined projection direction.