The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

May. 01, 2018
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Jie Cui, Santa Clara, CA (US);

Yuan Zhu, Beijing, CN;

Candy Yiu, Portland, OR (US);

Rui Huang, Beijing, CN;

Yang Tang, San Jose, CA (US);

Shuang Tian, Santa Clara, CA (US);

Dae Won Lee, Portland, OR (US);

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04L 1/16 (2006.01); H04W 56/00 (2009.01); H04W 88/06 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04L 1/1614 (2013.01); H04W 56/001 (2013.01); H04W 88/06 (2013.01);
Abstract

Technology for a user equipment (UE) operable to decode measurement gap patterns received from a Next Generation NodeB (gNB) is disclosed. The UE can decode a per-frequency range (per-FR) measurement gap pattern received from the gNB in a New Radio (NR) system. The per-FR measurement gap pattern can indicate a measurement gap partem for monitoring selected frequency layers within a frequency range at the UE. The UE can process one or more measurements for the selected frequency layers within the frequency range. The one or more measurements for the selected frequency layers can be measured in accordance with the per-FR measurement gap pattern. The UE can encode the one or more measurements for the selected frequency layers for reporting to the gNB.


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