The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
Mar. 18, 2019
Apple Inc., Cupertino, CA (US);
Aaron J. Cooper, San Jose, CA (US);
Amin Tayebi, San Jose, CA (US);
Breanna E. Bredesen, San Jose, CA (US);
Carlo Di Nallo, Belmont, CA (US);
Michael J. Williams, Cupertino, CA (US);
Nikolaj P. Kammersgaard, Copenhagen, DK;
Qian Zhang, La Jolla, CA (US);
Tyler R. Roschuk, Cupertino, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
An electronic device may be provided with wireless circuitry that is tested in a test system. The test system may include test probes. Circuitry under test may wirelessly transmit test signals. The test probes may receive the test signals at multiple locations. Circuitry may measure direct current (DC) voltages generated by the test probes and may convert the voltages to electric field magnitudes. A test host may process the electric field magnitudes to determine whether the circuitry under test exhibits a satisfactory radiation pattern. The test probes may include dielectric substrates and one or more dipole elements coupled to respective diodes. The dipole elements may include indium tin oxide (ITO) and may include first and second sets of orthogonal dipole elements. Transmission lines coupled to the dipole elements may include ITO and may form low pass filters that convert rectified voltages produced by the diodes into the DC voltages.