The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Dec. 31, 2019
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Gangyao Wang, Cary, NC (US);

Rajarshi Mukhopadhyay, Allen, TX (US);

Miguel Aguirre, Lucas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/011 (2006.01); H03K 17/687 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03K 3/011 (2013.01); H03K 17/687 (2013.01); H03M 1/12 (2013.01);
Abstract

Methods, apparatus, systems and articles of manufacture are described for transistor health monitoring. An example gate driver includes a request receiver pin, a measurement transmitter pin, and a driver control logic pin, the request receiver pin, the measurement transmitter pin, and the driver control logic pin configured to be coupled to a controller, a sensing pin, the sensing pin to be coupled to a sensing circuit, a control logic circuit having an input coupled to the request receiver pin, a transistor coupled to the control logic circuit and the sensing pin, a multiplexer coupled to the control logic circuit and the sensing pin, an analog-to-digital converter (ADC) coupled to the multiplexer and the measurement transmitter pin, and a driver control logic circuit coupled to the driver control logic pin.


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Wang, Gangyao. (2021). Methods and apparatus for transistor health monitoring (U.S. Patent No. 11070197). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11070197

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