The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Dec. 30, 2016
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Seungjune Jeon, Santa Clara, CA (US);

Haleh Tabrizi, San Francisco, CA (US);

Andrew Cullen, Midleton, IE;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G11C 16/34 (2006.01); G06F 11/10 (2006.01); G11C 29/52 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3495 (2013.01); G06F 3/0619 (2013.01); G06F 3/0652 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G06F 11/1068 (2013.01); G11C 29/52 (2013.01);
Abstract

In general, embodiments of the technology relate to a method for characterizing persistent storage. The method includes selecting a sample set of physical addresses in a solid state memory module, where the sample set of physical addresses is associated with a region in the solid state memory module (SSMM). The method further includes issuing a write request to the sample set of physical addresses, after issuing the write request, issuing a request read to the sample set of physical addresses to obtain a copy of the data stored in the sample set of physical addresses, obtaining an error parameter for the copy of the data, determining a calculated P/E cycle value for the SSMM using at least the error parameter; and storing the calculated P/E cycle value in the SSMM.


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