The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Jul. 01, 2019
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Philip Mewes, Nuremberg, DE;

Gunter Mueller, Heroldsberg, DE;

Assignee:

SIEMENS HEALTHCARE GMBH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/30 (2017.01); G06T 11/60 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0016 (2013.01); G06T 7/30 (2017.01); G06T 11/60 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30012 (2013.01); G06T 2207/30204 (2013.01);
Abstract

In an embodiment, a method includes acquiring a first image data set of the patient, via an X-ray apparatus, at a first time point during the operative intervention, the first image data set including the reference structure, the anatomical structure and the reference system between the reference structure and the anatomical structure; acquiring a second image data set of the patient at a second time point, the second image data set including at least the reference structure; registering the second image data set to the first image data set. As a result of the registering of the second image data set to the first image data set, a registered second image data set is determined. Finally, an embodiment of the method includes determining the validity of the reference system by a comparison of the registered second image data set with the first image data set.


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