The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Dec. 18, 2017
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Cagri Ozcaglar, Sunnyvale, CA (US);

Vijay K. Dialani, Fremont, CA (US);

Sara S. Gerrard, Stanford, CA (US);

Sahin C. Geyik, Redwood City, CA (US);

Anish R. Nair, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6231 (2013.01); G06K 9/6212 (2013.01); G06K 9/6219 (2013.01); G06K 9/6262 (2013.01);
Abstract

The disclosed embodiments provide a system for processing data. During operation, the system obtains a set of feature additions and an evaluation metric for assessing the performance of a statistical model. Next, the system automatically builds treatment versions of the statistical model using a set of baseline features for the statistical model and feature combinations generated using the feature additions. The system then uses a hypothesis test and a fixed set of feature values to compare a baseline value of the evaluation metric for a baseline version of the statistical model that is built using the set of baseline features with additional values of the evaluation metric for the treatment versions. Finally, the system outputs a result of the hypothesis test for use in assessing an impact of the feature combinations on a performance of the statistical model.


Find Patent Forward Citations

Loading…