The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
Apr. 13, 2018
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Alekh Jindal, Kirkland, WA (US);
Hiren Patel, Bothell, WA (US);
Shi Qiao, Bellevue, WA (US);
Jieming Di, Bellevue, WA (US);
Malay Kumar Bag, Kirkland, WA (US);
Zhicheng Yin, Kirkland, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Described herein is a system and method for detecting and reusing overlapping computations. Overlapping subgraphs of the query are determined using a normalized signature for a particular subgraph that identifies a particular subgraph across recurring instances of data. A normalized signature for each overlapping subgraph for the determined overlapping subgraphs of the query is provided. For each overlapping subgraph determined to be materialized: whether or not the particular subgraph has been materialized is determined using a precise signature corresponding to a normalized signature of the particular overlapping subgraph. The precise signature identifies a particular subgraph corresponding to the normalized signature within a particular recurring instance of data. When the particular subgraph has not been materialized, the subgraph is materialized and used to respond to the query. When the particular subgraph has been materialized, the materialized subgraph is used to respond to the query.