The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Aug. 16, 2019
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Naoya Ota, Tokyo, JP;

Kan Takeuchi, Tokyo, JP;

Fumio Tsuchiya, Tokyo, JP;

Masaki Shimada, Tokyo, JP;

Shinya Konishi, Tokyo, JP;

Daisuke Oshida, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); H03K 3/03 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0727 (2013.01); G06F 11/0751 (2013.01); H03K 3/0315 (2013.01);
Abstract

The semiconductor device has a module having a predetermined function, an error information acquisition circuit for acquiring error information about an error occurring in the module, a stress acquisition circuit for acquiring a stress accumulated value as an accumulated value of stress applied to the semiconductor device, and an analysis data storage for storing analysis data as data for analyzing the state of the semiconductor device, the error information and the stress accumulated value at the time of occurrence of the error being associated with each other.


Find Patent Forward Citations

Loading…