The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Jan. 23, 2019
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Xiangping Chen, Sherborn, MA (US);

Ying Hu, Northborough, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/065 (2013.01); G06F 3/067 (2013.01); G06F 3/0619 (2013.01); G06F 3/0653 (2013.01);
Abstract

In one aspect, adaptive replication modes in a storage system are provided. An aspect includes during an active replication session in which a first type of replication is performed at the storage system, monitoring write input/output (IO) operations, collecting data from the write IO operations, and determining, from the collected data, write IO latency. Upon determining that a threshold value has been met from the write IO latency, where the threshold value is defined for the first type of replication, an aspect includes automatically switching from the first type of replication to a second type of replication. The second type of replication is configured to compensate for operational deficiencies detected in response to the write IO latency.


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