The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
Nov. 30, 2016
Hitachi, Ltd., Tokyo, JP;
Yuji Ogata, Tokyo, JP;
Daisuke Ishii, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
A data collection system pertaining to one embodiment of the present invention collects time-series data which is output from sensors installed on equipment which is a monitored object and carries out detecting an abnormality of the equipment. The data collection system stores plural fault models as data for comparison with time-series data and, in a learning process, determines a range to examine within time-series data by comparing the time-series data with each one of the fault models. An abnormality detection process includes extracting a partial frequency spectrum to examine from the frequency spectrum of time-series data, using information on the range to examine within the time-series data determined through the learning process, and carrying out detecting an abnormality of the equipment using the extracted frequency spectrum.