The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Nov. 13, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Wei Luo, Yamanashi, JP;

Junichi Tezuka, Yamanashi, JP;

Tadashi Okita, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06K 15/02 (2006.01); G05B 19/4063 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0221 (2013.01); G05B 19/4063 (2013.01); G05B 23/0272 (2013.01); G06K 15/02 (2013.01);
Abstract

To provide an observation device, an observation method, and a computer-readable medium developed to allow checking of observation data in entirety. An observation device comprises: a data acquisition unit that acquires observation data together with temporal information, the observation data including at least one of an internal behavior signal about a numerical controller for controlling a machine tool, etc., and feed axis control data and spindle control data detected from a motor of the machine tool, etc.; a setting unit that sets a time scale for the observation data acquired by the data acquisition unit; a print data generation unit that generates print data including the observation data represented on the time scale set by the setting unit; and a print data output unit that outputs the print data generated by the print data generation unit to a printer capable of producing a long printed matter.


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