The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Sep. 13, 2018
Applicant:

Fraunhofer-gesellschaft Zur Förderung Der Angewandten Forschung E.v., München, DE;

Inventors:

Peter Dürr, Dresden, DE;

Alexander Mai, Dresden, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/22 (2006.01); G02B 27/09 (2006.01); G03H 1/02 (2006.01); G03H 1/00 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G03H 1/2294 (2013.01); G02B 27/0933 (2013.01); G02B 27/0944 (2013.01); G03F 7/70291 (2013.01); G03H 1/02 (2013.01); G03H 2001/0094 (2013.01); G03H 2001/0224 (2013.01); G03H 2001/221 (2013.01); G03H 2225/24 (2013.01);
Abstract

Apparatus for generating an optical pattern from image points in an image plane, including: a control unit; a micro-mirror array; an illumination unit controllable by the control unit; a focusing unit; the control unit being configured to control one or several micro-mirror groups formed of several micro-mirrors of the multitude of micro-mirrors such that the centroid beams reflected at the micro-mirrors of one of the micro-mirror groups meet in the image plane, and such that optical path lengths of the centroid beams reflected at the micro-mirrors of the respective micro-mirror group are equal from the illumination unit up to the image plane or differ by an integer multiple of a wavelength of the light beams in order to generate an image point of the image points in such a way.


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