The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
May. 02, 2017
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Florian Fahrbach, Mannheim, DE;
Frank Sieckmann, Eppingen-Elsenz, DE;
Christian Schumann, Lich, DE;
Oliver Schlicker, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A microscope includes illumination optics for fluorescence excitation of point light sources of a sample, detection optics and a camera having a sensor. A density of the point light sources is kept low so as to minimize a crossover of point light sources that are behind or close to one another in each image captured by the camera. A means for subdividing a detection aperture into individual sub-apertures is provided in a beam path of the detection optics such that images generated by the individual sub-apertures on the sensor of the camera depict an object volume from different spatial directions.