The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Aug. 22, 2018
Applicant:

National University Corporation Yokohama National University, Yokohama, JP;

Inventors:

Toshihiko Baba, Yokohama, JP;

Moe Takeuchi, Kawasaki, JP;

Hiroyuki Ito, Yokohama, JP;

Yuma Kusunoki, Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/12 (2006.01); G02B 6/10 (2006.01); G02F 1/29 (2006.01);
U.S. Cl.
CPC ...
G02B 6/10 (2013.01); G02F 1/29 (2013.01);
Abstract

In a light deflection device, the radiation efficiency of radiated light beams is to be improved. The light deflection device is configured by a photonic crystal waveguide having a lattice array with low refractive index parts periodically arrayed in a surface of a high refractive-index member. The lattice array has a dual-periodic structure consisting of a first periodic array and a second periodic array which differ from each other in periodic arrangement of the low refractive index parts. A line defect where no low refractive index parts are arrayed constitutes a waveguide core for propagating incident light. The cross section of at least either the first periodic array or the second periodic array constituting the periodic arrays of the dual-periodic structure is asymmetrical in the thickness direction of the low refractive index parts.


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