The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Nov. 12, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Eisuke Saneyoshi, Tokyo, JP;

Takahiro Toizumi, Tokyo, JP;

Kosuke Homma, Tokyo, JP;

Ryo Hashimoto, Tokyo, JP;

Katsuya Suzuki, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/02 (2006.01); G01R 21/133 (2006.01); G01R 19/25 (2006.01);
U.S. Cl.
CPC ...
G01R 21/133 (2013.01); G01R 19/2513 (2013.01);
Abstract

A monitoring device () includes a feature amount storage unit () that stores a device feature amount which is a feature amount of each of a plurality of electrical devices installed in a predetermined unit in operation; a measured data acquisition unit () that acquires measured data of the predetermined unit which is at least one of a total current consumption, a total power consumption, and a voltage measured in the predetermined unit; a feature amount extraction unit () that acquires a measurement feature amount which is the feature amount included in the measured data of the predetermined unit; a correction unit () that corrects a first feature amount which is the device feature amount or the measurement feature amount based on unit feature information indicating a feature of the predetermined unit; and a presumption unit () that presumes the electrical device being in operation using the corrected first feature amount, and a second feature amount which is the device feature amount or the measurement feature amount, and a different feature amount from the first feature amount.


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