The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
May. 31, 2018
Hitachi High-technologies Corporation, Tokyo, JP;
Akira Joji, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
To reduce the risk of mistaken operation and improve convenience in an automatic analysis device. Information about types of measurement inputted from an input device is combined in an examination mode creation screen imageon a display device of an automatic analysis device that performs analysis of specific types of measurement on a specimen container accommodating a specimen, the information about types of measurement including biochemistry examination items, immunology examination items, ISE examination items, blood clotting examination items, etc. This information is associated with an examination mode name, which comprises discretionary setting information, and is stored in a table of a storage unit. Information which is to be displayed on the display device and for which a change in settings is to be enabled is limited on the basis of the stored information about types of measurement associated with the examination mode name