The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Oct. 03, 2019
Applicant:

Endra Life Sciences Inc., Ann Arbor, MI (US);

Inventor:

Jang Hwan Cho, Ann Arbor, MI (US);

Assignee:

ENDRA Life Sciences Inc., Ann Arbor, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01); G01N 29/44 (2006.01); G01N 29/30 (2006.01);
U.S. Cl.
CPC ...
G01N 29/2431 (2013.01); G01N 29/30 (2013.01); G01N 29/4436 (2013.01);
Abstract

A method for determining a parameter of a material of interest which includes: directing, using a radio frequency (RF) source, RF energy into a region of interest, the region of interest comprising the material, a known reference and a boundary between the material and the known reference; detecting, using an acoustic receiver, at least one thermoacoustic multi-polar signal generated in response to the RF energy; and determining, by the one or more processors, a parameter of the material as a function of the at least one thermoacoustic multi-polar signal and a transmitted power correction factor, wherein the transmitted power correction factor is based on an estimated thickness of the known reference and an attenuation coefficient of the known reference.


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