The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
Aug. 02, 2017
Sharp Kabushiki Kaisha, Sakai, JP;
The University of Tokyo, Tokyo, JP;
Kunihiko Iizuka, Sakai, JP;
Yoshihisa Fujimoto, Sakai, JP;
Takeshi Mitsunaka, Sakai, JP;
Soo-Hyeon Kim, Tokyo, JP;
Teruo Fujii, Tokyo, JP;
SHARP KABUSHIKI KAISHA, Sakai, JP;
The University of Tokyo, Tokyo, JP;
Abstract
Provided are a fluorescent testing system, a dielectrophoresis device, and a molecular testing method that measure only fluorescence emitted from a test object without separating excitation light and the fluorescence by an optical filter and that are able to prevent reduction of an application range of a type of the fluorescence. A fluorescent testing system () includes: an excitation light source () that radiates excitation light (L) to a test object (M) flowing in a microfluidic channel (); a silicon integrated circuit () provided with a photon detection unit () that detects light by a photodiode (); a dielectrophoresis electrode pair () that generates an electric field (EF) to draw the test object (M) onto the photodiode () by dielectrophoresis; and a control unit () that causes the excitation light source () to radiate the excitation light (L) to the test object (M) that is drawn and causes the photon detection unit (), after extinguishment of the excitation light (L), to detect fluorescence (L) emitted from the test object (M).