The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
May. 13, 2016
Sacmi Cooperativa Meccanici Imola Societa' Cooperativa, Imola, IT;
Gildo Bosi, Bagnacavallo, IT;
Abstract
An apparatus () for optical inspection of a mass of polymeric material () passing through an extruder () having a hollow extrusion cylinder () extending elongately in a longitudinal direction comprises an optical sensor () which can be operatively coupled to the extrusion cylinder () and having an infrared light emitter () and a receiver () configured to measure a measurement parameter representing an optical property of the polymeric material () inside the extrusion cylinder () and is characterized in that it comprises a plurality of the optical sensors () which can be operatively coupled to the extrusion cylinder () in a plurality of measurement sites located in succession and spaced from each other along the longitudinal direction and a processor () programmed to acquire a plurality of measurement signals containing the measurement parameters measured by the corresponding optical sensors () and programmed to process the plurality of measurement signals in order to calculate a corresponding plurality of values of a control parameter indicating a physical state of the polymeric material () as a function of a longitudinal position.