The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
Jan. 25, 2019
Pratt & Whitney Canada Corp., Longueuil, CA;
Jeffrey Bernard Heyerman, Oakville, CA;
Antwan Shenouda, Mississauga, CA;
Michael Krynski, Waterdown, CA;
Poi Loon Tang, Montreal, CA;
PRATT & WHITNEY CANADA CORP., Longueuil, CA;
Abstract
There is described a shaft shear event detection method. The method comprises storing in memory a shaft oscillation signature determined as a function of known characteristics of the shaft and associated with a shaft shear event; monitoring a rotational speed of the shaft; detecting from the rotational speed an oscillation wave superimposed on the rotational speed by detecting a first period below a lower threshold and a second period above an upper threshold, and detecting a rate of occurrence of the first period and the second period, the oscillation wave having a wave modulation frequency corresponding to the rate of occurrence and a wave modulation amplitude; comparing the oscillation signature to the oscillation wave; and detecting the shaft shear event when the oscillation wave corresponds to the oscillation signature.