The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
Aug. 05, 2019
Applicant:
Parsons Corporation, Centreville, VA (US);
Inventors:
Matthew B. Campbell, Annandale, VA (US);
Andrew J. Dally, Lexington, NC (US);
Assignee:
PARSONS CORPORATION, Centreville, VA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/10 (2006.01); G01J 3/02 (2006.01); G01J 3/32 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/027 (2013.01); G01J 3/0254 (2013.01); G01J 3/10 (2013.01); G01J 3/32 (2013.01); G01J 2003/2826 (2013.01); G01J 2003/2866 (2013.01); G01J 2003/323 (2013.01);
Abstract
A multispectral material detection system captures spectral data and compares select spectral bands to reflectance spectra of a plurality of materials. The system identifies distinguishing features in reflectance spectra of a plurality of materials and in a plurality of spectral channels identifying distinguishing structural aspects of each material with respect to the background environments. Upon an observed spectral reflectance being proximate to one or more known spectra characteristics, the object is associated with a material of interest.