The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
Apr. 12, 2019
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Daisuke Sano, Moka, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01N 21/25 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01N 21/255 (2013.01); G01J 2003/2826 (2013.01);
Abstract
An analysis apparatus includes an estimator configured to estimate spectral information of an object based on information acquired by a spectroscope, and a processor configured to tag the spectral information of the object with a feature amount of the object. The estimator performs different estimation processing for each of a plurality of spectroscopes, and the processor performs regression processing common to the plurality of spectroscopes.
Sano, Daisuke. (2021). Analysis apparatus, imaging system, and storage medium (U.S. Patent No. 11067447). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11067447
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile