The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
Feb. 06, 2020
Applicant:
Hexagon Technology Center Gmbh, Heerbrugg, CH;
Inventors:
Frank Przygodda, Lindau, DE;
Thomas Jensen, Rorschach, CH;
Assignee:
HEXAGON TECHNOLOGY CENTER GMBH, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01B 11/303 (2013.01); G01B 9/02091 (2013.01);
Abstract
A method for measurement of a surface, in particular according to the principle of Optical Coherence Tomography, whereby distances to points of the surface are measured based on interferograms and classifying of measurements as non-valid or valid based on evaluation of phase change or amplitude change of a respective interferogram.
Przygodda, Frank. (2021). Method for gauging surfaces with classification of measurements as valid or non-valid (U.S. Patent No. 11067390). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11067390
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile