The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2021
Filed:
Nov. 13, 2018
Panasonic Corporation, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
A method of culturing cells including: dividing a culture area into a center area and a plurality of peripheral areas, and designating the center area and the plurality of peripheral areas as measurement positions; calculating: a confluent rate at each of the measurement positions designated; and an average confluent rate which is an average of sum of the confluent rates at the measurement positions designated, the confluent rate being defined as a proportion of an area occupied by cells in a designated area; and determining a timing to perform a subculture of the cells, based on the confluent rate, wherein the determining of the timing further includes determining when the average confluent rate is smaller than a first threshold value, the confluent rate of the center area is larger than a second threshold value, and the second threshold value is larger than the first threshold value.