The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Nov. 20, 2018
Applicant:

Elekta Limited, Crawley, GB;

Inventor:

David Anthony Roberts, East Grinstead, GB;

Assignee:

Elekta Limited, Crawley, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
A61N 5/1049 (2013.01); A61N 5/1045 (2013.01); A61N 5/1075 (2013.01); A61N 5/1077 (2013.01); A61N 5/107 (2013.01); A61N 5/1039 (2013.01); A61N 2005/1052 (2013.01); A61N 2005/1054 (2013.01); A61N 2005/1055 (2013.01); A61N 2005/1087 (2013.01);
Abstract

A method of operating a radiotherapy system mounted on a gantry surrounding a magnetic resonance imaging system is provided, the radiotherapy system comprising a radiotherapy beam generator, and a radiotherapy imaging system, wherein the gantry is arranged to rotate the radiotherapy beam generator around the magnetic resonance imaging system. The method comprises obtaining a reference image, the reference image including a predetermined feature of the magnetic resonance imaging system located near the radiotherapy imaging system; rotating the gantry relative the magnetic resonance imaging system; obtaining a second image, the second image including the predetermined feature of the magnetic resonance imaging system located near the radiotherapy imaging system; and determining changes in the relative positions of the radiotherapy beam generator, the radiotherapy imaging system, and the magnetic resonance imaging system based on differences in the position of the predetermined feature in the reference image and in the further image.


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