The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Mar. 13, 2018
Applicants:

National University Corporation Nagoya University, Aichi-ken, JP;

Nikkiso Co., Ltd., Tokyo, JP;

Inventors:

Michihiro Kono, Nagoya, JP;

Masashi Akiyama, Nagoya, JP;

Yasushi Ogawa, Nagoya, JP;

Hideki Asano, Hakusan, JP;

Suguru Mishina, Toyko, JP;

Satoru Matsuzawa, Toyko, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61N 5/06 (2006.01);
U.S. Cl.
CPC ...
A61B 5/441 (2013.01); A61B 5/0064 (2013.01); A61B 2560/0214 (2013.01); A61B 2562/0242 (2013.01); A61N 5/0616 (2013.01); A61N 2005/0628 (2013.01);
Abstract

A test device is used to test photosensitivity of a skin. The test device is provided with an irradiation unit including a plurality of light irradiation units arranged in a first direction. The plurality of light irradiation units output, in a second direction intersecting the first direction, irradiation light beams that mutually differ at least in one of wavelength characteristics and intensity. The irradiation unit is configured such that intensities of the irradiation light beams output from the plurality of light irradiation units are progressively smaller in the first direction.


Find Patent Forward Citations

Kono, Michihiro. (2021). Photosensitivity test device (U.S. Patent No. 11064935). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11064935

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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