The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Jan. 30, 2017
Applicant:

Fuji Corporation, Chiryu, JP;

Inventors:

Yuta Yokoi, Kariya, JP;

Hiroshi Oike, Chiryu, JP;

Takahiro Kobayashi, Chiryu, JP;

Keiichi Ono, Anjo, JP;

Assignee:

FUJI CORPORATION, Chiryu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H05K 13/08 (2006.01); G06T 7/70 (2017.01); H05K 13/04 (2006.01);
U.S. Cl.
CPC ...
H05K 13/0813 (2018.08); G06K 9/00664 (2013.01); G06T 7/70 (2017.01); H05K 13/0409 (2018.08); H05K 13/0818 (2018.08);
Abstract

A component mounting machine including a camera configured to capture an image of a component held by a suction nozzle; and an image processing section configured to process the image captured by the camera, recognize the shape of the component, and measure shape data of the component; wherein, when the deviation amount of the measurement value of the shape data of the component exceeds the allowable value, the deviation amount of the measurement value of the shape data of the component is compared to a retry determination that is larger than the allowance value, and if the deviation amount of the measurement value of the shape data of the component exceeds the retry determination value, the component is determined to be abnormal and is discarded to a specified discard location.


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