The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

May. 23, 2017
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Masahiko Nakamura, Kanagawa, JP;

Norihiko Akamatsu, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); H04N 5/369 (2011.01); H04N 9/04 (2006.01); G02B 7/34 (2021.01); G03B 13/36 (2021.01); H04N 9/07 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 5/36961 (2018.08); G02B 7/34 (2013.01); G03B 13/36 (2013.01); H01L 27/146 (2013.01); H01L 27/14605 (2013.01); H01L 27/14621 (2013.01); H01L 27/14623 (2013.01); H01L 27/14627 (2013.01); H04N 5/369 (2013.01); H04N 5/379 (2018.08); H04N 9/0455 (2018.08); H04N 9/07 (2013.01); H04N 5/232122 (2018.08);
Abstract

The present technology relates to an imaging element, an imaging apparatus, and electronic equipment which are capable of accurately detecting phase difference. The imaging element includes a first light-receiving part that receives incident light entering through a first on-chip lens, a first phase detecting pixel which is placed between the first on-chip lens and the first light-receiving part and which has a shading film to limit an amount of light reaching the first light-receiving part, and a second phase detecting pixel which has a second light-receiving part to receive incident light entering through a second on-chip lens, with the second light-receiving part being divided into a plurality of light-receiving regions. The technique disclosed herein is applicable to imaging apparatuses having the autofocusing function.


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