The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Jan. 08, 2020
Applicant:

Takashi Ando, Tokyo, JP;

Inventor:

Takashi Ando, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 5/225 (2006.01); G03B 5/00 (2021.01);
U.S. Cl.
CPC ...
H04N 5/23287 (2013.01); G03B 5/00 (2013.01); H04N 5/2253 (2013.01); H04N 5/2254 (2013.01); G03B 2205/0015 (2013.01);
Abstract

An imaging-element inclination adjustment mechanism including at least one adjustment member attached to an imaging-element unit in a manner that a position of the adjustment member is adjustable relative to the imaging-element unit, the imaging-element unit holding an imaging element; at least one support member secured to a housing; and at least one securing member engaged with the adjustment member and attached to the support member. The position of the adjustment member is adjusted relative to the imaging-element unit to adjust a position of the imaging-element unit relative to the support member. The support member supports the imaging-element unit via the adjustment member at each of at least three positions.


Find Patent Forward Citations

Ando, Takashi. (2021). Imaging-element inclination adjustment mechanism, method for adjusting inclination of imaging element, and imaging apparatus (U.S. Patent No. 11064120). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11064120

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