The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Jul. 29, 2020
Applicant:

Vector Atomic, Inc., Pleasanton, CA (US);

Inventors:

Arman Cingoz, Pleasanton, CA (US);

Abijith Sudarsan Kowligy, Pleasanton, CA (US);

Jonathan David Roslund, Pleasanton, CA (US);

Assignee:

VECTOR ATOMIC, INC., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); H04L 7/00 (2006.01); G02B 6/42 (2006.01); H04J 14/02 (2006.01); H04J 14/00 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0075 (2013.01); G02B 6/42 (2013.01); H04J 14/02 (2013.01);
Abstract

Embodiments herein describe sub-picosecond accurate two-way clock synchronization by optically combining received optical pulses with optical pulses generated locally in a photonic chip before the optical signals are then detected by a photodetector to obtain an interference measurement. That is, the optical pulses can have different repetition rates so that the offset between the received and local optical pulses constantly changes, thereby resulting in different interference measurements. Optically combining the pulses in the photonic chip avoids much of the jitter introduced by the electronics. Further, the sites can obtain multiple interference measurements which can be evaluated to accurately determine when the optical pulses arrive at the site with femtosecond accuracy.


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