The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Aug. 08, 2019
Applicant:

Zhongshan Ophthalmic Center of Sun Yat-sen University, Guangdong, CN;

Inventors:

Haotian Lin, Guangdong, CN;

Xiaohang Wu, Guangdong, CN;

Weiyi Lai, Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06N 20/00 (2019.01); A61B 3/117 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 3/1176 (2013.01); G06K 9/00536 (2013.01); G06N 20/00 (2019.01); G06T 2207/20081 (2013.01); G06T 2207/30041 (2013.01);
Abstract

The invention relates to an artificial intelligence cataract analysis system, including a pattern recognition module for recognizing a photo mode of an input eye image, wherein the photo mode is divided according to the slit width of the illuminating slit during photographing of the eye image and/or whether a mydriatic treatment is carried out; a preliminary analysis module used for selecting a corresponding deep learning model for eye different photo modes, analyzing the characteristics of lens in the eye image by using a deep learning model, and further performing classification in combination with cause and severity degree of a disease. The invention can perform cataract intelligent analysis on eye images with different photo modes by using deep learning models, so that the analysis accuracy is improved.


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