The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Mar. 13, 2018
Applicants:
Carmel Haifa University Economic Corporation Ltd., Haifa, IL;
Technion Research & Development Foundation Limited, Haifa, IL;
Inventors:
Assignees:
CARMEL HAIFA UNIVERSITY ECONOMIC CORPORATION LTD., Haifa, IL;
TECHNION RESEARCH & DEVELOPMENT FOUNDATION LIMITED, Haifa, IL;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 5/50 (2006.01); G06T 7/90 (2017.01); H04N 9/04 (2006.01); H04N 9/64 (2006.01);
U.S. Cl.
CPC ...
G06T 5/009 (2013.01); G06T 5/50 (2013.01); G06T 7/90 (2017.01); H04N 9/0451 (2018.08); H04N 9/646 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20224 (2013.01);
Abstract
A method comprising acquiring a first image of a scene inside a medium, under illumination from a first location or orientation. The method comprises an action of acquiring a second image of the scene inside the medium, under illumination from a second, different location or orientation. The method comprises an action of computing attenuation coefficients, one per color channel, based on backscatter in the first and second images.