The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Oct. 26, 2018
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Yusuke Kudo, Shiojiri, JP;

Hirohiko Kihara, Matsumoto, JP;

Hiroto Yomo, Shiojiri, JP;

Takaaki Akie, Azumino, JP;

Takaaki Ozawa, Shiojiri, JP;

Shiki Furui, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 11/60 (2006.01); G09G 3/00 (2006.01); G09G 3/36 (2006.01);
U.S. Cl.
CPC ...
G06T 5/006 (2013.01); G06T 11/60 (2013.01); G09G 3/002 (2013.01); G09G 3/36 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30204 (2013.01);
Abstract

A projector includes a projection section that projects a first image on a projection surface, a control section that causes the projection section to project a pattern image for installation including a first pattern that is located at an end of the first image, which overlaps with a second image, and a second pattern that is so disposed that a first straight line section is located in a position separate from the end by a distance, and a correction section that corrects the first image based on a captured image containing an image of a first area of the second image, and the first area is an area that overlaps with an area having a width corresponding to the distance measured from the end of the first image in a state in which the first image and the second image overlap with each other.


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