The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Dec. 18, 2018
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Toshihiro Morisawa, Tokyo, JP;

Yasuharu Namba, Tokyo, JP;

Toshiyuki Ukai, Tokyo, JP;

Naohiro Suzuki, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/20 (2013.01); G06Q 10/067 (2013.01); G06Q 10/06393 (2013.01);
Abstract

Various failure rates are supposed for each facility, and an optimal maintenance plan is made. A maintenance planning apparatus includes a failure rate model generation unit that generates a failure rate model on the basis of failure probability information which is set for an O&M asset by a user, a simulation execution unit that executes simulation regarding a failure which possibly occurs in the O&M asset in a plurality of different conditions on the basis of the generated failure rate model, a KPI computation unit that computes a KPI corresponding to each of the plurality of different conditions on the basis of results of the simulation, and an analysis unit that analyzes the plurality of different conditions and KPIs respectively corresponding to the plurality of different conditions, so as to determine an optimal condition corresponding to the best KPI.


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