The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Aug. 26, 2020
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Kanwar Inder Singh, Danville, CA (US);

Shinichiro Shuda, Beverly Hills, CA (US);

Christopher Donnelly, Winnetka, IL (US);

Praveen Kishorepuria, Avon, OH (US);

Aaron L. Shifrin, Deerfield, IL (US);

Todd Bremer, Dove Canyon, CA (US);

Vivek Nadiminti, Chicago, IL (US);

Barton FitzGerald Keery, Brooklyn, NY (US);

Harshavardhan Basantkumar Kar, Marietta, GA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/022 (2013.01);
Abstract

A self-learning system for analytical attribute and clustering segmentation may be provided. A text classifier may identify a log description of a log entry in response to text of the log description being associated with indicators of a word model. A datafield classifier may generate a datafield metrics including an accuracy value of the attribute identifiers representing the datafield. A metafield classifier may generate a context metrics for the context of the log entry, the context metrics including an accuracy value of the attribute identifiers representing the metafields. A combination classifier may form a weighted classification set and select an attribute identifier as being representative of the datafield based on the weighted classification set. The combination classifier may further evaluate an attribute importance value of each attribute identifier, and select an attribute identifier having a top attribute importance value.


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