The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Dec. 02, 2015
Applicant:

The Climate Corporation, San Francisco, CA (US);

Inventors:

Lijuan Xu, Foster City, CA (US);

Ying Xu, Boston, MA (US);

Assignee:

THE CLIMATE CORPORATION, San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06Q 10/04 (2012.01); G06Q 50/02 (2012.01); G06N 3/12 (2006.01); G06N 3/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06N 20/00 (2019.01); G06Q 10/04 (2013.01); G06Q 50/02 (2013.01); G06N 3/006 (2013.01); G06N 3/126 (2013.01);
Abstract

A method for predicting field specific crop yield recommendations is disclosed. A computer system receives data records, including remotely sensed spectral property of plant records and soil moisture records. The system aggregates the records to create geo-specific time series over a specified time. The system selects representative features from the geo-specific time series and creates, for each specific geographic area, a covariate matrix in computer memory comprising the representative features. The system assigns a probability value to a component group in a set of parameter component groups, where each component group includes one or more regression coefficients and an error term calculated from probability distributions. The system is programmed to generate generates the probability distributions used to determine the regression coefficients and the error term, the probability distribution used to generate the error term is defined with a mean parameter set at zero and a variance parameter set to a field specific bias coefficient.


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