The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Jul. 08, 2019
Applicant:
Nant Holdings Ip, Llc, Culver City, CA (US);
Inventor:
Matheen Siddiqui, Culver City, CA (US);
Assignee:
Nant Holdings IP, LLC, Culver City, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); H04N 1/40 (2006.01); G06F 16/51 (2019.01); G06F 16/783 (2019.01); G06F 16/907 (2019.01); G06F 16/33 (2019.01); G06F 16/583 (2019.01); G06F 16/732 (2019.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4652 (2013.01); G06F 16/3331 (2019.01); G06F 16/51 (2019.01); G06F 16/5838 (2019.01); G06F 16/7335 (2019.01); G06F 16/785 (2019.01); G06F 16/907 (2019.01); G06K 9/00476 (2013.01); G06K 9/4604 (2013.01); G06K 9/4671 (2013.01); H04N 1/40012 (2013.01);
Abstract
Apparatus, methods and systems of object recognition are disclosed. Embodiments of the inventive subject matter generates map-altered image data according to an object-specific metric map, derives a metric-based descriptor set by executing an image analysis algorithm on the map-altered image data, and retrieves digital content associated with a target object as a function of the metric-based descriptor set.