The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Jan. 25, 2019
Advanced New Technologies Co., Ltd., Grand Cayman, KY;
Longfei Li, Hangzhou, CN;
Advanced New Technologies Co., Ltd., Grand Cayman, KY;
Abstract
This specification describes techniques for detecting abnormal data in a data set. One example method includes obtaining, by a data processing platform, a to-be-validated data group including to-be-validated data corresponding to a predetermined feature; obtaining, by the data processing platform, a comparison data group including historical data associated with the to-be-validated data group, wherein the historical and the to-be-validated data are from a same data source; performing, by the data processing platform, a two-group significance test on the to-be-validated data group and the comparison data group to generate a test result; and determining, by the data processing platform, whether there is abnormal data in the to-be-validated data group based on the test result.