The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Oct. 25, 2018
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Panasonic Corporation, Kadoma, JP;
Jungho Park, Gwangmyeong-si, KR;
Ajay Raghavan, Mountain View, CA (US);
Ryan A. Rossi, Mountain View, CA (US);
Yosuke Tajika, Hyogo, JP;
Akira Minegishi, Osaka, JP;
Tetsuyoshi Ogura, Osaka, JP;
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Panasonic Corporation, Kadoma, JP;
Abstract
One embodiment provides a system for facilitating anomaly detection and characterization. During operation, the system determines, by a computing device, a first set of testing data which includes a plurality of data points, wherein the first set includes a data series for a first variable and one or more second variables. The system identifies anomalies by dividing the first set into a number of groups and performing an inter-quartile range analysis on data in each respective group. The system obtains, from the first set, a second set of testing data which includes a data series from a recent time period occurring before a current time, and which further includes a first data point from the identified anomalies. The system classifies the first data point as a first type of anomaly based on whether a magnitude of a derivative of the second set is greater than a first predetermined threshold.