The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Sep. 25, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Pablo Loyola, Tokyo, JP;

Kugamoorthy Gajananan, Tokyo, JP;

Fumiko Akiyama, Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3616 (2013.01); G06F 11/3608 (2013.01); G06F 11/3692 (2013.01); G06N 20/00 (2019.01);
Abstract

A code dependency influenced bug localization apparatus and method receive bug reports and source code changes of a software program. Each source code change includes a syntax component and a location component. Each bug report includes a functional description of an aspect of the software program. The apparatus and method obtain a vectorized feature representation of each bug report, apply a learning process to the source code changes based on a code dependency among the source code changes, obtain a vectorized feature representation of each source code change based on the code dependency, merge the feature representations of the bug reports and the feature representations of the source code changes into a plurality of unified feature representations, and apply a ranking process to the unified feature representations to produce a source code relating function for relating a bug report and a source code change.


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